Goodness-of-fit tests for type-I extreme-value and 2-parameter Weibull distributionsSHIMOKAWA, T; MIN LIAO.IEEE transactions on reliability. 1999, Vol 48, Num 1, pp 79-86, issn 0018-9529Article

Weighted voting systemsNORDMANN, L; HOANG PHAM.IEEE transactions on reliability. 1999, Vol 48, Num 1, pp 42-49, issn 0018-9529Article

An implicit method for incorporating common-cause failures in system analysisVAURIO, J. K.IEEE transactions on reliability. 1998, Vol 47, Num 2, pp 173-180, issn 0018-9529Article

Applying Software reliability Engineering in the 1990sEVERETT, W; KEENE, S; NIKORA, A et al.IEEE transactions on reliability. 1998, Vol 47, Num 3, pp 372-378, issn 0018-9529, 2Article

Communications reliability : A historical perspectiveMALEC, H. A.IEEE transactions on reliability. 1998, Vol 47, Num 3, pp 333-345, issn 0018-9529, 2Article

Continuous-state system-reliability : An interpolation approachBRUNELLE, R. D; KAPUR, K. C.IEEE transactions on reliability. 1998, Vol 47, Num 2, pp 181-187, issn 0018-9529Article

Electronics reliability : A personal viewEVANS, R. A.IEEE transactions on reliability. 1998, Vol 47, Num 3, pp 329-332, issn 0018-9529, 2Article

Radiation hardness of static random-access-memory tested using dose-to-failure and gamma-ray exposureCHANG-LIAO, K.-S; FENG, K.-H.IEEE transactions on reliability. 1998, Vol 47, Num 2, pp 155-158, issn 0018-9529Article

Ring-network with a constrained number of consecutively-bypassed stationsDAO, H. M; SILIO, C. B.IEEE transactions on reliability. 1998, Vol 47, Num 1, pp 35-43, issn 0018-9529Article

Robust estimation of the Birnbaum-Saunders distributionDUPUIS, D. J; MILLS, J. E.IEEE transactions on reliability. 1998, Vol 47, Num 1, pp 88-95, issn 0018-9529Article

Sequential tests for integrated-circuit failuresCHANDRAMOULI, R; VIJAYKRISHNAN, N; RANGANATHAN, N et al.IEEE transactions on reliability. 1998, Vol 47, Num 4, pp 463-471, issn 0018-9529Article

Bayes results for classical Pareto distribution via Gibbs sampler, with doubly-censored observationsUPADHYAY, S. K; SHASTRI, V.IEEE transactions on reliability. 1997, Vol 46, Num 1, pp 56-59, issn 0018-9529Article

Fast optimal diagnosis procedures for k-out-of-n:G systemsSALLOUM, S; BREUER, M. A.IEEE transactions on reliability. 1997, Vol 46, Num 2, pp 283-290, issn 0018-9529Article

Reliability assessment from fatigue micro-crack dataWILSON, S. P; TAYLOR, D.IEEE transactions on reliability. 1997, Vol 46, Num 2, pp 165-172, issn 0018-9529Article

Time-censored ramp tests with stress bound for Weibull life distributionBAI, D. S; CHUN, Y. R; CHA, M. S et al.IEEE transactions on reliability. 1997, Vol 46, Num 1, pp 99-107, issn 0018-9529Article

Proactive network-fault detectionHOOD, C. S; JI, C.IEEE transactions on reliability. 1997, Vol 46, Num 3, pp 333-341, issn 0018-9529Article

Redundancy optimization of static series-parallel reliability models under uncertaintyRUBINSTEIN, R. Y; LEVITIN, G; LISNIANSKI, A et al.IEEE transactions on reliability. 1997, Vol 46, Num 4, pp 503-511, issn 0018-9529Article

Reliability evaluation for distributed computing networks with imperfect nodesKE, W.-J; WANG, S.-D.IEEE transactions on reliability. 1997, Vol 46, Num 3, pp 342-349, issn 0018-9529Article

Reliability-based optimal task-allocation in distributed-database management systemsAJIT KUMAR VERMA; MANGESH TRIMBAK TAMHANKAR.IEEE transactions on reliability. 1997, Vol 46, Num 4, pp 452-459, issn 0018-9529Article

System-reliability confidence-intervals for complex-systems with estimated component-reliabilityCOIT, D. W.IEEE transactions on reliability. 1997, Vol 46, Num 4, pp 487-493, issn 0018-9529Article

Decision theory in maintenance strategy of standby system with Gamma-distribution repair-timeDE ALMEIDA, A. T; BOHORIS, G. A.IEEE transactions on reliability. 1996, Vol 45, Num 2, pp 216-219, issn 0018-9529Article

Engineering notion of mean-residual-life & hazard-rate for finite populations with known distributionsEBRAHIMI, N.IEEE transactions on reliability. 1996, Vol 45, Num 3, pp 362-368, issn 0018-9529Article

Estimating the cumulative downtime distribution of a highly reliable componentJESKE, D. R.IEEE transactions on reliability. 1996, Vol 45, Num 3, pp 369-374, issn 0018-9529Article

Generalized linear models in software reliability : Parametric & semi-parametric approachesEL AROUI, M.-A; LAVERGNE, C.IEEE transactions on reliability. 1996, Vol 45, Num 3, pp 463-470, issn 0018-9529Article

Hierarchical Bayes estimation for the exponential-multinomial model in reliability and competing risksPAPADOPOULOS, A. S; TIWARI, R. C; ZALKIKAR, J. N et al.IEEE transactions on reliability. 1996, Vol 45, Num 3, pp 477-484, issn 0018-9529Article